Modern Interferometry for Length Metrology
Exploring limits and novel techniques
Contributions by Dr. Florian Pollinger, Dr. Arnold Nicolaus, Dr. Guido Bartl, Dr Thilo Schuldt, Dr. Nandini Bhattacharya, Dr. Steven van den Berg, Prof. Dr. Seung-Woo Kim, Dr. Yoon-Soo Jang, Prof. Dr. Armin Reichhold, Dr. Birk Andreas, Dr. Christoph Weichert Edited by Professor René Schödel

Publication date:
21 December 2018Length of book:
324 pagesPublisher
Institute Of Physics PublishingDimensions:
254x178mm7x10"
ISBN-13: 9780750315760
Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.